ASTM E 2382 : 2004 : R2012
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
Hardcopy , PDF
04-12-2020
English
19-12-2012
Important note : Users cannot be edited or removed once added to your Multi user PDF.CONTAINED IN VOL. 03.06, 2016 Defines a description of commonly observed artifacts in scanning tunneling microscopy (STM) and atomic force microscopy (AFM) relating to probe motion and geometric considerations of the tip and surface interaction, provide literature references of examples and, where possible, to offer an interpretation as to the source of the artifact.
| Committee |
E 42
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| DocumentType |
Guide
|
| Pages |
18
|
| ProductNote |
Reconfirmed 2012
|
| PublisherName |
American Society for Testing and Materials
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
1.1All microscopes are subject to artifacts. The purpose of this document is to provide a description of commonly observed artifacts in scanning tunneling microscopy (STM) and atomic force microscopy (AFM) relating to probe motion and geometric considerations of the tip and surface interaction, provide literature references of examples and, where possible, to offer an interpretation as to the source of the artifact. Because the scanned probe microscopy field is a burgeoning one, this document is not meant to be comprehensive but rather to serve as a guide to practicing microscopists as to possible pitfalls one may expect. The ability to recognize artifacts should assist in reliable evaluation of instrument operation and in reporting of data.
| ASTM E 2859 : 2011 : R2017 | Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy |
| ASTM E 1813 : 1996 : R2007 | Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy (Withdrawn 2016) |
| ASTM E 1813 : 1996 : EDT 1 | Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy |
| ASTM E 1813 : 1996 : R2002 | Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy |
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