ASTM E 1577 : 2004
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Standard Guide for Reporting of Ion Beam Parameters Used in Surface Analysis
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ASTM E 1636 : 2004
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Standard Practice for Analytically Describing Sputter-Depth-Profile Interface Data by an Extended Logistic Function
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ASTM E 1829 : 2014
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Standard Guide for Handling Specimens Prior to Surface Analysis
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ASTM E 1217 : 2000
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Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
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ASTM E 1127 : 1991 : R1997
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Standard Guide for Depth Profiling in Auger Electron Spectroscopy
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ASTM E 2108 : 2010
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Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
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ASTM E 1217 : 2011
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Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
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ASTM E 1078 : 2002
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Standard Guide for Specimen Preparation and Mounting in Surface Analysis
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ASTM E 1523 : 2009
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Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
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ASTM E 1078 : 1997
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Standard Guide for Procedures for Specimen Preparation and Mounting in Surface Analysis
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ASTM E 1577 : 2011
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Standard Guide for Reporting of Ion Beam Parameters Used in Surface Analysis (Withdrawn 2020)
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ASTM E 1217 : 2005
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Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
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ASTM E 2108 : 2016
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Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
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ASTM E 1523 : 2003
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Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
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ASTM E 1636 : 2010
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Standard Practice for Analytically Describing Depth-Profile and Linescan-Profile Data by an Extended Logistic Function (Withdrawn 2019)
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ASTM E 1127 : 2008
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Standard Guide for Depth Profiling in Auger Electron Spectroscopy
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ASTM E 1523 : 2015
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Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy (Withdrawn 2024)
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ASTM E 1829 : 2002
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Standard Guide for Handling Specimens Prior to Surface Analysis
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ASTM E 1829 : 2009
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Standard Guide for Handling Specimens Prior to Surface Analysis
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ASTM E 2108 : 2005
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Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
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ASTM E 1523 : 1997
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Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
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ASTM E 2108 : 2000
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Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
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ASTM E 1634 : 2002 : R2007
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Standard Guide for Performing Sputter Crater Depth Measurements
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ASTM E 1127 : 2008 : R2015
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Standard Guide for Depth Profiling in Auger Electron Spectroscopy (Withdrawn 2024)
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ASTM E 1634 : 2011 : R2019
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Standard Guide for Performing Sputter Crater Depth Measurements
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ASTM E 1078 : 2014
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Standard Guide for Specimen Preparation and Mounting in Surface Analysis
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ASTM E 1577 : 1995 : R2000
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Standard Guide for Reporting of Ion Beam Parameters Used in Surface Analysis
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ASTM E 1634 : 2011
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Standard Guide for Performing Sputter Crater Depth Measurements
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ASTM E 1634 : 1994 : R1999
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Standard Guide for Performing Sputter Crater Depth Measurements
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ASTM E 1636 : 1994 : R1999
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Standard Practice for Analytically Describing Sputter-Depth-Profile Interface Data by an Extended Logistic Function
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ASTM E 1634 : 2002
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Standard Guide for Performing Sputter Crater Depth Measurements
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ASTM E 1127 : 2003
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Standard Guide for Depth Profiling in Auger Electron Spectroscopy
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ASTM E 1829 : 1997
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Standard Guide for Handling Specimens Prior to Surface Analysis
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ASTM E 1217 : 2011(R2019)
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Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
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ASTM E 1078 : 2009
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Standard Guide for Specimen Preparation and Mounting in Surface Analysis
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