ASTM E 996 : 2019
Current
The latest, up-to-date edition.
Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
Hardcopy , PDF
English
01-04-2019
Auger and X-ray photoelectron spectra are obtained using a variety of excitation methods, analyzers, signal processing, and digitizing techniques.
Committee |
E 42
|
DocumentType |
Standard Practice
|
Pages |
3
|
PublisherName |
American Society for Testing and Materials
|
Status |
Current
|
Supersedes |
1.1Auger and X-ray photoelectron spectra are obtained using a variety of excitation methods, analyzers, signal processing, and digitizing techniques.
1.2This practice lists the desirable information that shall be reported to fully describe the experimental conditions, specimen conditions, data recording procedures, and data transformation processes.
1.3The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.4This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.
1.5This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
ASTM E 1127 : 1991 : R1997 | Standard Guide for Depth Profiling in Auger Electron Spectroscopy |
ASTM E 1078 : 2002 | Standard Guide for Specimen Preparation and Mounting in Surface Analysis |
ASTM E 1078 : 1997 | Standard Guide for Procedures for Specimen Preparation and Mounting in Surface Analysis |
ASTM E 1127 : 2008 | Standard Guide for Depth Profiling in Auger Electron Spectroscopy |
ASTM E 1127 : 2008 : R2015 | Standard Guide for Depth Profiling in Auger Electron Spectroscopy (Withdrawn 2024) |
ASTM E 1078 : 2014 | Standard Guide for Specimen Preparation and Mounting in Surface Analysis |
ASTM E 1127 : 2024 | Standard Guide for Depth Profiling in Auger Electron Spectroscopy |
ASTM E 1127 : 2003 | Standard Guide for Depth Profiling in Auger Electron Spectroscopy |
ASTM E 1078 : 2009 | Standard Guide for Specimen Preparation and Mounting in Surface Analysis |
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