ASTM F 1190 : 1999
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Standard Guide for Neutron Irradiation of Unbiased Electronic Components
Hardcopy , PDF
11-11-2014
English
31-12-2010
Committee |
F 01
|
DocumentType |
Standard Practice
|
Pages |
5
|
PublisherName |
American Society for Testing and Materials
|
Status |
Superseded
|
SupersededBy | |
Supersedes |
1.1 This practice applies to the exposure of unbiased silicon (Si) or gallium arsenide (GaAs) semiconductor components to neutron radiation from a nuclear reactor source. Only the conditions of exposure are addressed in this practice. The effects of radiation on the test sample should be determined using appropriate electrical test methods.
1.2 System and subsystem exposures and test methods are not included in this practice.
1.3 This practice is applicable to irradiations conducted with the reactor operating in either the pulsed or steady-state mode. The practical limits for neutron fluence ([phi]eq,1MeV,Si or [phi]eq,1MeV,GaAs) in semiconductor testing range from approximately 10 to 10 16 n/cm .
1.4 This practice addresses those issues and concerns pertaining to irradiations with neutrons of energies greater than 10 keV.
1.5 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
ASTM E 1854 : 2019 | Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts |
ASTM E 2450 : 2016 | Standard Practice for Application of CaF<inf>2</inf>(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments |
ASTM E 1854 : 2013 | Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts |
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