ASTM F 1262M : 2014 : REDLINE
Current
The latest, up-to-date edition.
Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)
English
01-06-2014
Important note : Users cannot be edited or removed once added to your Multi user PDF.CONTAINED IN VOL. 10.04, 2015 Defines experimenters in measuring the transient radiation upset threshold of silicon digital integrated circuits exposed to pulses of ionizing radiation greater than 10[3] Gy (matl.)/s.
| Committee |
F 01
|
| DocumentType |
Redline
|
| Pages |
7
|
| PublisherName |
American Society for Testing and Materials
|
| Status |
Current
|
1.1This guide is to assist experimenters in measuring the transient radiation upset threshold of silicon digital integrated circuits exposed to pulses of ionizing radiation greater than 103 Gy (matl.)/s.
1.1.1Discussion—This document is intended to be a guide to determine upset threshold, and is not intended to be a stand-alone document.
1.2This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
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