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ASTM F 1263 : 1999 : R2005

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts

Available format(s)

PDF

Language(s)

English

Published date

01-01-2005

Superseded date

15-09-2020

Superseded by

ASTM F 1263 : 2011

Committee
F 01
DocumentType
Guide
Pages
3
PublisherName
American Society for Testing and Materials
Status
Superseded
SupersededBy
Supersedes

1.1 This guide covers the use of overtesting in order to reduce the required number of parts that must be tested to meet a given quality acceptance standard. Overtesting is testing a sample number of parts at a stress higher than their specification stress in order to reduce the amount of necessary data taking. This guide discusses when and how overtesting may be applied to forming probabilistic estimates for the survival of electronic piece parts subjected to radiation stress. Some knowledge of the probability distribution governing the stress-to-failure of the parts is necessary though exact knowledge may be replaced by over-conservative estimates of this distribution.

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