ASTM F 1263 : 2011 : REDLINE
Current
The latest, up-to-date edition.
Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
English
01-06-2011
Important note : Users cannot be edited or removed once added to your Multi user PDF.CONTAINED IN VOL. 10.04, 2015 Deals with the use of overtesting so as to reduce the number of components that must be tested to meet a quality acceptance standard.
| Committee |
F 01
|
| DocumentType |
Redline
|
| Pages |
3
|
| PublisherName |
American Society for Testing and Materials
|
| Status |
Current
|
1.1 This guide covers the use of overtesting in order to reduce the required number of parts that must be tested to meet a given quality acceptance standard. Overtesting is testing a sample number of parts at a stress level higher than their specification stress in order to reduce the amount of necessary data taking. This guide discusses when and how overtesting may be applied to forming probabilistic estimates for the survival of electronic piece parts subjected to radiation stress. Some knowledge of the probability distribution governing the stress-to-failure of the parts is necessary, although exact knowledge may be replaced by over-conservative estimates of this distribution.
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