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ASTM F 1893 : 1998

ASTM F 1893 : 1998

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices

Available format(s)

Hardcopy , PDF

Superseded date

11-11-2014

Language(s)

English

Published date

10-05-1998

Publisher

American Society for Testing and Materials

Committee
F 01
DocumentType
Guide
Pages
5
PublisherName
American Society for Testing and Materials
Status
Superseded
SupersededBy

1.1 This guide defines the detailed requirements for testing microcircuits for short pulse high dose-rate ionization-induced failure. Large flash x-ray (FXR) machines operated in the photon mode, or FXR e-beam facilities are required because of the high dose-rate levels that are necessary to cause burnout. Two modes of test are possible (1) survival test, and (2) A failure level test.

1.2 The values stated in International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this standard.

ASTM F 1262M : 2014 Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)

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PDF - English
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