ASTM F 1893 : 1998
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices
Hardcopy , PDF
11-11-2014
English
10-05-1998
Important note : Users cannot be edited or removed once added to your Multi user PDF.| Committee |
F 01
|
| DocumentType |
Guide
|
| Pages |
5
|
| PublisherName |
American Society for Testing and Materials
|
| Status |
Superseded
|
| SupersededBy |
1.1 This guide defines the detailed requirements for testing microcircuits for short pulse high dose-rate ionization-induced failure. Large flash x-ray (FXR) machines operated in the photon mode, or FXR e-beam facilities are required because of the high dose-rate levels that are necessary to cause burnout. Two modes of test are possible (1) survival test, and (2) A failure level test.
1.2 The values stated in International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this standard.
| ASTM F 1262M : 2014 | Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric) |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.