Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices

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Superseded date

12-08-2020

Language(s)

English

Published date

01-07-1998

Publisher

American Society for Testing and Materials

Committee	F 01
DocumentType	Guide
Pages	5
PublisherName	American Society for Testing and Materials
Status	Superseded
Supersedes	ASTM F 1893 : 1998

1.1 This guide defines the detailed requirements for testing microcircuits for short pulse high dose-rate ionization-induced failure. Large flash x-ray (FXR) machines operated in the photon mode, or FXR e-beam facilities are required because of the high dose-rate levels that are necessary to cause burnout. Two modes of test are possible (1) survival test, and (2) A failure level test.

1.2 The values stated in International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this standard.

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ASTM F 1893 : 1998 : R2003

Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices

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