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GUIDE FOR MEASUREMENT OF IONIZING DOSE-RATE SURVIVABILITY AND BURNOUT OF SEMICONDUCTOR DEVICES
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Superseded date: 31-08-2020
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Published date: 01-02-2011
Publisher: American Society for Testing and Materials
CONTAINED IN VOL. 10.04, 2018 Defines the detailed requirements for testing semiconductor devices for short-pulse high dose-rate ionization-induced survivability and burnout failure.
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