ASTM F 1893 : 2011
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices
English
01-01-2011
03-12-2023
| Committee |
F 01
|
| DocumentType |
Guide
|
| Pages |
7
|
| PublisherName |
American Society for Testing and Materials
|
| Status |
Superseded
|
| SupersededBy |
1.1 This guide defines the detailed requirements for testing semiconductor devices for short-pulse high dose-rate ionization-induced survivability and burnout failure. The test facility shall be capable of providing the necessary dose rates to perform the measurements. Typically, large flash X-ray (FXR) machines operated in the photon mode, or FXR e-beam facilities are utilized because of their high dose-rate capabilities. Electron Linear Accelerators (LINACs) may be used if the dose rate is sufficient. Two modes of test are described: (1) A survivability test, and (2) A burnout failure level test.
1.2 The values stated in International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this standard.
| ASTM F 1262M : 2014 | Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric) |
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