ASTM F 1996 : 2014
Current
Current
The latest, up-to-date edition.
Standard Test Method for Silver Migration for Membrane Switch Circuitry (Withdrawn 2023)
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
13-11-2014
Important note : Users cannot be edited or removed once added to your Multi user PDF.| Committee |
F 01
|
| DocumentType |
Test Method
|
| Pages |
3
|
| PublisherName |
American Society for Testing and Materials
|
| Status |
Current
|
| Supersedes |
1.1This test method is used to determine the susceptibility of a membrane switch to the migration of the silver between circuit traces under dc voltage potential.
1.2Silver migration will occur when special conditions of moisture and electrical energy are present.
| ASTM F 1596 : 2015 | Standard Test Method for Exposure of a Membrane Switch or Printed Electronic Device to Temperature and Relative Humidity (Withdrawn 2024) |
| ASTM F 1689 : 2005 | Standard Test Method for Determining the Insulation Resistance of a Membrane Switch |
| ASTM F 1596 : 2000 : R2005 | Standard Practice for Exposure of Membrane Switches to Temperature and Relative Humidity |
| ASTM F 1596 : 2007 | Standard Test Method for Exposure of Membrane Switches to Temperature and Relative Humidity |
| ASTM F 1596 : 2000 | Standard Practice for Exposure of Membrane Switches to Temperature and Relative Humidity |
| ASTM F 1689 : 1996 | Standard Test Method for Determining the Insulation Resistance of a Membrane Switch |
| ASTM F 1689 : 2002 | Standard Test Method for Determining the Insulation Resistance of a Membrane Switch |
| ASTM F 1689 : 2005 : R2012 | Standard Test Method for Determining the Insulation Resistance of a Membrane Switch |
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