ASTM F 487 : 2013
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Standard Specification for Fine Aluminum–1 % Silicon Wire for Semiconductor Lead-Bonding
Hardcopy , PDF
12-01-2024
English
01-01-2013
CONTAINED IN VOL. 10.04, 2018 Defines aluminum - 1% silicon alloy wire for internal connections in semiconductor devices and is limited to wire of diameter up to and including 76 [mu]m (0.003 in.).
Committee |
F 01
|
DocumentType |
Standard
|
Pages |
4
|
ProductNote |
Reconfirmed 2013
|
PublisherName |
American Society for Testing and Materials
|
Status |
Superseded
|
SupersededBy | |
Supersedes |
1.1This specification covers aluminum–1 % silicon alloy wire for internal connections in semiconductor devices and is limited to wire of diameter up to and including 76 μm (0.003 in.). For diameters larger than 76 μm (0.003 in.), the specifications are to be agreed upon between the purchaser and the supplier.
ASTM F 219 : 1996 | Standard Test Methods of Testing Fine Round and Flat Wire for Electron Devices and Lamps |
MIL-STD-105 Revision E:1989 | SAMPLING PROCEDURES AND TABLES FOR INSPECTION BY ATTRIBUTES |
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