• Shopping Cart
    There are no items in your cart

ASTM F 487 : 2013

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

Standard Specification for Fine Aluminum–1 % Silicon Wire for Semiconductor Lead-Bonding

Available format(s)

Hardcopy , PDF

Superseded date

12-01-2024

Language(s)

English

Published date

01-01-2013

€59.22
Excluding VAT

CONTAINED IN VOL. 10.04, 2018 Defines aluminum - 1% silicon alloy wire for internal connections in semiconductor devices and is limited to wire of diameter up to and including 76 [mu]m (0.003 in.).

Committee
F 01
DocumentType
Standard
Pages
4
ProductNote
Reconfirmed 2013
PublisherName
American Society for Testing and Materials
Status
Superseded
SupersededBy
Supersedes

1.1This specification covers aluminum–1 % silicon alloy wire for internal connections in semiconductor devices and is limited to wire of diameter up to and including 76 μm (0.003 in.). For diameters larger than 76 μm (0.003 in.), the specifications are to be agreed upon between the purchaser and the supplier.

1.2The values stated in SI units are to be regarded as the standard, regardless of whether they appear first or second in a table. Values given in parentheses are for information only.

ASTM F 219 : 1996 Standard Test Methods of Testing Fine Round and Flat Wire for Electron Devices and Lamps
MIL-STD-105 Revision E:1989 SAMPLING PROCEDURES AND TABLES FOR INSPECTION BY ATTRIBUTES

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.