ASTM F 487 : 2013 : R2018
Current
The latest, up-to-date edition.
Standard Specification for Fine Aluminum–1 % Silicon Wire for Semiconductor Lead-Bonding (Withdrawn 2024)
Hardcopy , PDF
English
10-04-2018
Important note : Users cannot be edited or removed once added to your Multi user PDF.CONTAINED IN VOL. 10.04, 2018 Defines aluminum - 1% silicon alloy wire for internal connections in semiconductor devices and is limited to wire of diameter up to and including 76 [mu]m (0.003 in.).
| Committee |
F 01
|
| DocumentType |
Standard
|
| Pages |
4
|
| ProductNote |
Reconfirmed 2018
|
| PublisherName |
American Society for Testing and Materials
|
| Status |
Current
|
| Supersedes |
1.1This specification covers aluminum–1 % silicon alloy wire for internal connections in semiconductor devices and is limited to wire of diameter up to and including 76 μm (0.003 in.). For diameters larger than 76 μm (0.003 in.), the specifications are to be agreed upon between the purchaser and the supplier.
1.2The values stated in SI units are to be regarded as the standard, regardless of whether they appear first or second in a table. Values given in parentheses are for information only.
1.3This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
| ASTM F 219 : 1996 | Standard Test Methods of Testing Fine Round and Flat Wire for Electron Devices and Lamps |
| ASTM F 16 : 2012 : R2022 | Standard Test Methods for Measuring Diameter or Thickness of Wire and Ribbon for Electronic Devices and Lamps (Withdrawn 2023) |
| ASTM F 16 : 2012 : R2017 | Standard Test Methods for Measuring Diameter or Thickness of Wire and Ribbon for Electronic Devices and Lamps |
| ASTM F 219 : 1996 : R2018 | Standard Test Methods of Testing Fine Round and Flat Wire for Electron Devices and Lamps (Withdrawn 2023) |
| MIL-STD-105 Revision E:1989 | SAMPLING PROCEDURES AND TABLES FOR INSPECTION BY ATTRIBUTES |
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