ASTM F 980 : 1992
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Guide for The Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
Hardcopy , PDF
11-11-2014
English
31-12-2010
Important note : Users cannot be edited or removed once added to your Multi user PDF.| Committee |
F 01
|
| DocumentType |
Guide
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| Pages |
5
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| PublisherName |
American Society for Testing and Materials
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| Status |
Superseded
|
| SupersededBy |
1.1 This guide defines the requirements and procedures for testing silicon discrete semiconductor devices and integrated circuits for rapid-annealing effects from displacement damage resulting from neutron radiation. This test will produce degradation of the electrical properties of the irradiated devices and should be considered a destructive test. Rapid annealing of displacement damage is usually associated with bipolar technologies.
1.2 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of whoever uses this standard to consult and establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. Specific hazard information is given in 4.2.7.
| ASTM F 1190 : 2018 | Standard Guide for Neutron Irradiation of Unbiased Electronic Components |
| ASTM E 1854 : 2019 | Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts |
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