ASTM F 980 : 2010
NA
NA
Status of Standard is Unknown
Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
10-06-1996
Committee |
F 01
|
DocumentType |
Guide
|
Pages |
5
|
PublisherName |
American Society for Testing and Materials
|
Status |
NA
|
SupersededBy | |
Supersedes |
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