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ASTM F 980 : 2016 : R2024

Current

Current

The latest, up-to-date edition.

Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

05-01-2024

€56.53
Excluding VAT

Committee
E 10
DocumentType
Guide
Pages
7
PublisherName
American Society for Testing and Materials
Status
Current
Supersedes

1.1This guide defines the requirements and procedures for testing silicon discrete semiconductor devices and integrated circuits for rapid annealing effects from displacement damage resulting from neutron radiation. This test will produce degradation of the electrical properties of the irradiated devices and should be considered a destructive test. Rapid annealing of displacement damage is usually associated with bipolar technologies.

1.1.1Heavy ion beams can also be used to characterize displacement damage annealing (1),2 but ion beams have significant complications in the interpretation of the resulting device behavior due to the associated ionizing dose. The use of pulsed ion beams as a source of displacement damage is not within the scope of this standard.

1.2The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.3This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.

1.4This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

ASTM F 1190 : 2018 Standard Guide for Neutron Irradiation of Unbiased Electronic Components
ASTM E 1854 : 2019 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts

ASTM E 1894 : 2018 Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources
ASTM E 1894 : 2024 Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources

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