BS 5069-1:1980
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Dimensions of piezoelectric devices Specification for standard outlines and pin connections for quartz crystal units
Available format(s)
Hardcopy , PDF
Superseded date
13-12-2002
Superseded by
Language(s)
English
Published date
30-09-1980
Publisher
Important note : Users cannot be edited or removed once added to your Multi user PDF.
National foreword
Cooperating organizations
Specification
Chapter IV. Standard outlines
1 Crystal enclosure dimensions
2 Designation of crystal unit outlines
Data sheets
Chapter V. Pin connections
3 Internal connections
4 Pin connections of crystal vibrators with two
electrodes
5 Pin connections of crystal vibrators with three
electrodes
6 Pin connections of crystal vibrators with four
electrodes
Tables
I
II
III Tables for conversion from inches into millimetres
IV Tables for conversion from millimetres into inches
Specifies the outline and pin connections of crystal unit enclosures sealed by solder, welding or glass encapsulation techniques.
| Committee |
W/-
|
| DocumentType |
Standard
|
| Pages |
98
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| IEC 60122-3:2010 | Identical |
| IEC 60122-3:1977 | Identical |
| BS 9617:1982 | Rules for the preparation of detail specifications for quartz crystal units of assessed quality. Full assessment level |
| BS 9616:1984 | Blank detail specification for quartz crystal units of assessed quality: basic assessment level |
| BS 9611 N009:1977 | Detail specification for solder-sealed quartz crystal units for oscillator applications. AA, CX and BC/1 enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level |
| BS 9612 N016:1979 | Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level |
| BS 9612 N017:1979 | Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level |
| BS 9612 N015:1979 | Detail specification for cold welded seal quartz crystal units for oscillator applications. DK enclosure, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level |
| BS 9612 N013:1979 | Detail specification for cold welded seal quartz crystal units for oscillator applications. DK enclosure, 25 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level |
| BS 9611 N008:1977 | Detail specification for solder-sealed quartz crystal units for oscillator applications. AA, CX and BC/1 enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level |
| BS 9612 N005:1977 | Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level |
| BS 9611 N004:1977 | Detail specification for solder-sealed quartz crystal units for oscillator applications. AA, BF, CX and BC/1 enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level |
| BS 9612 N007:1977 | Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, DQ and DP enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level |
| BS 9611 N006:1977 | Detail specification for solder-sealed quartz crystal units for oscillator applications. AA, CX, BF and BC/1 enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non- temperature controlled). Full assessment level |
| BS 9612 N008:1977 | Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, DQ and DP enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level |
| BS 9612 N020:1979 | Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level |
| BS 9612 N018:1979 | Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level |
| BS 9610:1982 | Specification for quartz crystal units of assessed quality: generic data and methods of test |
| BS 9612 N006:1977 | Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, 47 U/2, DQ and DP enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level |
| BS 9612 N011:1979 | Detail specification for cold welded seal quartz crystal units for oscillator applications. DK enclosure, 6.0 to 25 MHz frequency range. Fundamental thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level |
| BS 9611 N007:1977 | Detail specification for solder-sealed quartz crystal units for oscillator applications. AA, CX and BC/1 enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level |
| BS 9612 N019:1979 | Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level |
| BS 9612 N012:1979 | Detail specification for cold-welded seal quartz crystal units for oscillator applications. DK enclosures, 25 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level |
| BS 9612 N009:1977 | Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, DQ and DP enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level |
| BS 9612 N010:1979 | Detail specification for cold welded seal quartz crystal units for oscillator applications. DK enclosure, 6.0 to 25 MHz frequency range. Fundamental thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level |
| BS 9611 N005:1977 | Detail specification for solder-sealed quartz crystal units for oscillator applications. AA, CX and BC/1 enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level |
| BS 9612 N004:1977 | Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, 47 U/2, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level |
| BS 9612 N021:1979 | Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level |
| BS 9612 N014:1979 | Detail specification for cold welded seal quartz crystal units for oscillator applications. DK enclosure, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level |
| BS 448-1:1981 | Dimensions of electronic tubes and valves IEC dimensions |
| ISO 370:1975 | Toleranced dimensions Conversion from inches into millimetres and vice versa |
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