BS 5760-18(1997) : 1997 AMD 10390

Committees responsible
National foreword
Introduction
Guide
1 Scope
2 Normative references
3 Definitions
4 Symbols
5 Reference conditions
6 Generic stress models
7 Specific stress models
Annexes
A (informative) Limitations of reliability models
    and predictions
B (informative) Examples
C (informative) Bibliography
Tables
1 Reference conditions for climatic and mechanical
    stresses
2 Reference conditions for electrical stresses -
    Summary
3 Constants
4 Factor pU for digital CMOs-family ICs
5 Factor pU for bipolar analogue integrated circuits
6 Constants for integrated circuits
7 Constants for transistors
8 Factor pU for transistors
9 Constants for discrete semiconductors
10 Constants for phototransistors
11 Factor pU for phototransistors
12 Constants for LEDs and IREDs
13 Factor pI for LEDs and IREDs
14 Constants for optoelectronic components
15 Constants for capacitors (voltage dependence)
16 Factor pU for capacitors
17 Constants for capacitors (temperature dependence)
18 Factor pT for capacitors
19 Constants for resistors
20 Constants for transformers, inductors and coils
21 Factor pES for low current relays
22 Factor pES for general purpose relays
23 Factor pES for automotive relays
24 Constants for relays
25 Factor pT for relays
26 Factor pES for switches and push-buttons for low
    electrical stress
27 Factor pES for switches and push-buttons for
    higher electrical stress
28 Factor pU for pilot and signal lamps
Figures
1 Factor pT for IC (without EPROM, OTPROM, EEPROM,
    EAROM)
2 Factor pT for EPROM, OTPROM, EEPROM, EAROM
3 Factor pT for transistors, reference and microwave
    diodes
4 Factor pT for general-purpose diodes, Schottky
    diodes, voltage regulators and Zener diodes, power
    semiconductors
5 Factor pT for LEDs, IREDs and optocouplers
6 Factor pT for phototransistors, photodiodes,
    photoresistors and photocells
7 Factor pT for resistors
8 Factor pT for transformers, inductors and coils
9 Selection of stress regions in accordance with
    current and voltage-operating conditions
10 Factor pS depending on the operating cycles
11 Selection of stress regions in accordance with
    current and voltage-operating conditions
A.1 Time dependence of the failure rate

Supplies guidelines on failure rate data for reliability prediction of components in electronic equipment. Defines reference conditions for failure rate data for comparison purposes. Should failure rate data are given according to this standard, no additional information of specified conditions is needed.