BS 7317-6:1990
Current
The latest, up-to-date edition.
Methods for analysis of high purity copper cathode Cu-CATH-1 Method for determination of phosphorus and silicon by spectrophotometry
Hardcopy , PDF
English
31-07-1990
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Foreword
Committees responsible
Method
1. Scope
2. Principle
3. Reagents
4. Apparatus
5. Procedure for phosphorus
6. Procedure for silicon
7. Repeatability and reproducibility
8. Test report
Tables
1. Phosphorus calibration solutions
2. Silicon calibration solutions
Applies to low levels in high purity copper cathode specified in BS 6017.
| Committee |
NFE/34
|
| DevelopmentNote |
Supersedes BS DD95-6(1987) (09/2005) Reviewed and confirmed by BSI, October 2008. (09/2008)
|
| DocumentType |
Standard
|
| Pages |
10
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
This Part of BS 7317 describes a method for the determination of the actual amounts of the impurity elements phosphorus and silicon present in high purity copper cathode (designated Cu-CATH-1), by spectrophotometry. It is applicable to concentrations of the elements not exceeding the following limits:
| phosphorus | 20 µg/g (0.0020 % m/m) maximum; |
| silicon | 25 µg/g (0.0025 % m/m) maximum. |
NOTE The titles of the publications referred to in this Part of BS 7317 are listed on the inside back cover.
| BS 7317-7:1990 | Methods for analysis of high purity copper cathode Cu-CATH-1 Method for determination of lead by lanthanum hydroxide separation and atomic absorption spectrophotometry |
| BS 6017:1981 | Specification for copper refinery shapes |
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