BS 7640-1(1993) : 1993 AMD 8679
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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GUIDE TO HIGH-VOLTAGE TEST TECHNIQUES FOR LOW-VOLTAGE EQUIPMENT - DEFINITIONS, TEST AND PROCEDURE REQUIREMENTS
15-08-1995
23-11-2012
Committees responsible
National foreword
Introduction
Section 1. General
1.1 Scope
1.2 Normative references
Section 2. Definitions
2.1 Impulse techniques and insulation
2.2 Characteristics related to disruptive discharge
and test voltages
Section 3. General requirements relating to test
procedures and test objects
3.1 General requirements for test procedures
3.2 General arrangement of the test object
3.3 Atmospheric conditions
Section 4. Tests with direct voltage
4.1 Definitions for direct voltage tests
4.2 Test voltage
4.3 Test procedures
Section 5. Tests with alternating voltage
5.1 Definitions for alternative voltage tests
5.2 Test voltage
5.3 Test procedures
Section 6. Tests with impulse voltage
6.1 Definitions for impulse tests
6.2 Test voltage
6.3 Test procedures
Section 7. Tests with impulse current
7.1 Definitions for impulse current tests
7.2 Test current
7.3 Test procedures
Section 8. Composite tests
8.1 Definitions for composite tests
8.2 Tests with hybrid impulse generators
8.3 Test procedures with the hybrid impulse generator
alone
8.4 Test procedures with the hybrid impulse generator
and mains
8.5 Test procedure with the conventional 1, 2/50
impulse generator and mains
Annexes
A (informative) Arrangements for composite tests
B (informative) Information to be given in the test
report
Figures
1 Evaluation of impulse voltage waveshape
2 Examples of impulses with oscillations or overshoot
3 Evaluation of impulse current waveshape
A.1 Circuit arrangement for composite tests
Covers the high voltage testing of low voltage equipment (having a rated voltage of not over 1 kV a.c. or 1,5 kV d.c.). Applies to: dielectric tests with alternating voltage; tests with impulse current; dielectric tests with direct voltage; dielectric tests with impulse current; tests with combination of the above. Includes annexes and diagrams. BS AMD 8679 RENUMBERS THIS STANDARD TO BS EN 61180 PT1
Committee |
PEL/62
|
DevelopmentNote |
Renumbered and superseded by BS EN 61180-1. Supersedes 87/22772 DC. (11/2005)
|
DocumentType |
Standard
|
PublisherName |
British Standards Institution
|
Status |
Superseded
|
SupersededBy |
Standards | Relationship |
IEC 61180-1:1992 | Identical |
BS EN 61180-2:1995 | High-voltage test techniques for low-voltage equipment Test equipment |
IEC 60270:2000+AMD1:2015 CSV | High-voltage test techniques - Partial discharge measurements |
IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
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