BS 7681-3(1993) : 1993 AMD 9659
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS BY ZERO PHASE TECHNIQUES IN A x-NETWORK - BASIC METHOD FOR THE MEASUREMENT OF TWO-TERMINAL PARAMETERS UP TO 200 MHz BY PHASE TECHNIQUE IN A X-NETWORK WITH COMPENSATION OF THE PARALLEL CAPACITANCE C
15-10-1997
23-11-2012
Committees responsible
National foreword
Method
1 Scope
2 Co compensation circuit
2.1 Electrical specifications
2.2 Mechanical specifications
3 Crystal unit parameters with and without Co
compensation
3.1 Series resonance frequency fs and resonance
frequency fr
3.2 Motional resistance R1 and resonance resistance Rr
3.3 Motional capacitance C1 and motional inductance L1
4 Test circuit
4.1 The pi-network
4.2 Accessories of the pi-network
4.3 Associated equipment
4.4 Compensation circuit
5 Method of measurement
5.1 Initial calibration of the pi-network
5.2 Tuning of the compensation circuit
5.3 Frequency and resistance measurement
5.4 Evaluation of the motional capacitance C1 and
motional inductance L1
Appendices
A Analysis of the difference of f, R, C1, and L1 as
a result of measurement methods with and without
compensation of Co
B Additional information on accuracy
C Additional information on circuit components given
in Figures 4a) and 4b)
Table
A1 Typical values for parameters of oscillator crystal
units, and the calculated theoretical differences
between parameters increased with and without
compensation
Figures
1 Equivalent circuit of a crystal unit with
compensation of Co
2 Impedance diagram of a crystal unit without
compensation of parallel capacitance Co
3 Impedance diagram of a crystal unit when Co is
compensated with a properly tuned compensation
network according to Figure 1
4a Simplified diagram of the pi-network with
electrical adjustment of Co compensation
4b Simplified diagram of the pi-network with
mechanical adjustment of Co compensation
5 Test circuit
Specifies a method for the measurement of the parameters of quartz crystal units. Coverage includes electrical specifications, mechanical specifications, and compensation circuit. Also includes appendices and diagrams. AMD 9659 RENUMBERS THIS STANDARD
| Committee |
ECL/11
|
| DevelopmentNote |
Renumbered and superseded by BS EN 60444-3 (11/2005)
|
| DocumentType |
Standard
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.