Committees responsible
National foreword
Methods
1. Scope
2. Introduction
3. Measurement procedures
4. Choice of admittance measurement method
5. Calibration techniques
6. Low-frequency measurements
7. Admittance analysis and estimation of the equivalent
circuit parameters
8. Measurement errors, instrumentation and test fixtures
Annexes
A. (normative) Calibration
B. (informative) Low-frequency measurement
C. (informative) Bibliography
Figures
1. Measurement sequence
2. Measurement methods, admittance analysis and parameter
estimation techniques
3. One-port equivalent circuit of a single-mode quartz
crystal unit
4. Two-port equivalent circuit of a single-mode quartz
crystal unit
5. Admittance and impedance circle of a quartz crystal
unit for frequencies near an isolated mode of
vibration
6. General one-port equivalent circuit for multiple
resonances
7. Two-port equivalent circuit for multiple resonances
8. Procedure for the determination of the equivalent
circuit parameters of a quartz crystal unit
9. Calibration verification for S-parameter measurement
10. APC-3.5 Transmission fixture
11. APC-7 Transmission fixture
12. APC-7 Reflection fixture
13. APC-3.5 One-port fixture
14. APC-3.5 Two-port fixture
15. Direct transmission measurement fixture
A.1 Simplified one-port network analyzer
A.2 Simplified two-port, three-channel network analyzer
A.3 Signal flowgraph representation for proposed 12-term
error model
A.4 Typical direct transmission system
A.5 Equivalent circuit for direct transmission method
A.6 Thin-film calibration resistor
A.7 Modified SMA terminating resistor
B.1 Simplified network analyzer test system for low-
frequency measurements
B.2 1:2 Directional bridge for low-frequency measurements
B.3 1:1 Directional bridge for low-frequency measurements