BS 7681-6(1995) : 1995 AMD 9662

Committees responsible
National foreword
Introduction
1 General
1.1 Scope
1.2 Normative references
2 DLD effects
2.1 Reversible changes in frequency and resistance
2.2 Irreversible changes in frequency and resistance
2.3 Causes of DLD effects
3 Drive levels for DLD measurement
4 Test methods
4.1 Test method A (network method)
4.2 Test method B (oscillator method)
Annex
A (normative) Relationship between electrical drive
    level and mechanical displacement of quartz crystal
    units
Figures
1 Maximum tolerable resistance ratio for the drive
    level dependence as a function of the resistances
    Rr2 or Rr3
2 Insertion of a quartz unit in an oscillator
3 Crystal unit loss resistance as a function of
    dissipated power
4 Behaviour of the Rr of a quartz crystal unit
5 Block diagram of method B
6 Installed - Rosc in scanned drive level range
7 Drive level behaviour of a quartz crystal unit as a
    function of drive level focused against an installed
    - Rosc as a test limit in the method B TEST
8 Principle schematic diagram of the go/no-go test
    circuit of method B

Applies to measuring drive level dependence (DLD) of quartz crystal units. AMD 9662 RENUMBERS THIS STANDARD