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  • BS 9970-0:1985

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    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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    Harmonized system of quality assessment for electronic components. Semiconductor devices Generic specification

    Available format(s):  Hardcopy, PDF

    Superseded date:  30-09-1991

    Language(s):  English

    Published date:  31-05-1985

    Publisher:  British Standards Institution

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    Abstract - (Show below) - (Hide below)

    Provides scope and general details, quality assessment procedures, test and measurement procedures and details of sampling plans.

    General Product Information - (Show below) - (Hide below)

    Committee EPL/47
    Document Type Standard
    Publisher British Standards Institution
    Status Superseded
    Superseded By

    Standards Referenced By This Book - (Show below) - (Hide below)

    BS QC 750005:1987 Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Voltage-regulator diodes and voltage-reference diodes, excluding temperature-compensated precision reference diodes
    BS QC 750001:1986 Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Signal diodes, switching diodes and controlled avalanche diodes
    BS QC 750103:1990 Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for low-frequency amplification
    BS CECC 90000:1991 Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
    BS QC 750110:1990 Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Reverse blocking triode thyristors, ambient and case-rated, up to 100 A
    BS CECC 90200:1988 Harmonized system of quality assessment for electronic components: sectional specification: analogue monolithic integrated circuits
    BS CECC 90300:1988 Harmonized system of quality assessment for electronic components. Sectional specification: interface monolithic integrated circuits
    BS QC 750108:1990 Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, up to 100 A
    BS QC 750112:1988 Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for single-gate field-effect transistors, up to 5 W and 1 GHz
    BS QC 750102:1990 Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Ambient-rated bipolar transistors for low and high-frequency amplification
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