• BS CECC 41000:1977

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    Harmonized system of quality assessment for electronic components: generic specification for potentiometers

    Available format(s):  Hardcopy, PDF

    Superseded date:  30-11-2009

    Language(s):  English

    Published date:  31-08-1977

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    Foreword
    Preface
    Section 1 - Scope
    Section 2 - General
    2.1 Related documents
    2.2 Units, symbols and terminology
    2.3 Standard and preferred values
    2.4 Marking
    Section 3 - Quality assessment procedures
    3.1 Primary stage of manufacture
    3.2 Structurally similar parts
    3.3 Qualification approval procedure
    3.4 Quality conformance inspection
    3.5 Certified test records
    3.6 Delayed delivery
    3.7 Alternative test methods
    3.8 Release for delivery before the completion of
          Group B tests
    3.9 Unchecked parameters
    Section 4 - Test and measurement procedures
    4.1 Standard conditions for testing
    4.2 Drying
    4.3 Visual examination and check of dimensions
    4.4 Continuity
    4.5 Element resistance
    4.6 Terminal resistance
    4.7 Attenuation
    4.8 Mechanical and electrical travel
    4.9 Resistance law
    4.10 Matching of resistance law
    4.11 Switch contact resistance
    4.12 Voltage proof
    4.13 Insulation resistance
    4.14 Temperature characteristic of resistance
    4.15 Rotational noise
    4.16 Starting torque
    4.17 Switch torque
    4.18 End stop torque
    4.19 Locking torque
    4.20 Thrust and pull on spindle
    4.21 Robustness of terminations
    4.22 Sealing
    4.23 Soldering
    4.24 Change of temperature
    4.25 Vibration
    4.26 Bump
    4.27 Shock
    4.28 Climatic sequence
    4.29 Damp heat, steady state
    4.30 Mechanical endurance (potentiometers)
    4.31 Mechanical endurance (switch) (when fitted)
    4.32 Electrical endurance
    Section 5 - Blank detail specification
    5.1 General
    5.2 Identification of the harmonized detail
          specification
    5.3 Identification of the potentiometer
    5.4 Supplementary information
    5.5 Test schedule
    Appendix A
    Appendix B
    Appendix C
    Appendix D
    Appendix E
    Appendix F
    Appendix G

    Abstract - (Show below) - (Hide below)

    Terminology and methods of test.

    General Product Information - (Show below) - (Hide below)

    Committee W/-
    Development Note Supersedes 73/22512 DC. (01/2006)
    Document Type Standard
    Publisher British Standards Institution
    Status Superseded
    Superseded By
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    BS 9000(1967) : LATEST
    BS 1852:1952 Colour codes for fixed resistors for telecommunication purposes.
    BS E9006(1976) : LATEST HARMONISED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BASIC SPECIFICATION. ENVIRONMENTAL PROCEDURES
    BS E9007:1975 Specification for harmonized system of quality assessment for electronic components: Basic specification: Sampling plans and procedures for inspection by attributes
    BS 5054(1974) : LATEST DIMENSIONS OF SPINDLE ENDS FOR MANUALLY OPERATED ELECTRONIC COMPONENTS
    BS 2488:1966 Schedule of preferred numbers for the resistance of resistors and the capacitance of capacitors for telecommunication equipment
    BS 2045:1965 Preferred numbers
    BS 4727(1971) : LATEST
    IEC 60393-1:2008 Potentiometers for use in electronic equipment - Part 1: Generic specification
    BS 9130:1972 Specification for potentiometers of assessed quality: generic data and methods of test
    BS 5555:1976 Specification for SI units and recommendations for the use of their multiples and of certain other units
    BS 1991-6:1963 Letter symbols, signs and abbreviations. Electrical science and engineering.
    BS 3939:1966 Graphic symbols for electrical and electronic diagrams
    BS 2011(1967) : LATEST
    BS 6001(1972) : AMD 5054 SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - SPECIFICATION FOR SAMPLING PLANS INDEXED BY ACCEPTABLE QUALITY LEVEL (AQL) FOR LOT - BY - LOT INSPECTION
    IEC 60115-1:2008 Fixed resistors for use in electronic equipment - Part 1: Generic specification
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