• BS CECC14000(1984) : 1984 AMD 7575

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION: PHOTOMULTIPLIER TUBES

    Available format(s): 

    Superseded date:  15-02-1993

    Language(s): 

    Published date:  06-12-2012

    Publisher:  British Standards Institution

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    Abstract - (Show below) - (Hide below)

    Applies to photomultiplier tubes of assessed quality. BS AMD 7575 renumbers this standard to BS EN 114000

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    Committee ECL/5
    Development Note Renumbered and superseded by BS EN 114000. Supersedes 80/29001 DC. (08/2005)
    Document Type Standard
    Publisher British Standards Institution
    Status Superseded
    Superseded By

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60462:2010 Nuclear instrumentation - Photomultiplier tubes for scintillation counting - Test procedures
    IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
    IEC 60134:1961 Rating systems for electronic tubes and valves and analogous semiconductor devices
    CECC 00100 : 1988 BASIC RULES - TO BE USED IN CONNECTION WITH THE INTERNAL REGULATIONS OF THE FEN e.V
    IEC 60151-15:1967 Measurements of the electrical properties of electronic tubes and valves. Part 15: Methods of measurement of spurious and unwanted electrode currents
    IEC 60306-4:1971 Measurement of photosensitive devices. Part 4: Methods of measurement for photo-multipliers
    IEC 60151-1:1963 Measurements of the electrical properties of electronic tubes and valves - Part 1: Measurement of electrode current
    IEC 60027-1:1992 Letters symbols to be used in electrical technology - Part 1: General
    IEC 60306-1:1969 Measurement of photosensitive devices - Part 1: Basic recommendations
    IEC 60410:1973 Sampling plans and procedures for inspection by attributes
    IEC 60067:1966 Dimensions of electronic tubes and valves
    CECC 00007 : 1978 BASIC SPECIFICATION: SAMPLING PLANS AND PROCEDURES FOR INSPECTION BY ATTRIBUTES
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