BS CECC50001(1981) : 1981 AMD 7590

Superseded

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SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION: GENERAL PURPOSE SEMICONDUCTOR DIODES

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Superseded date: 15-02-1993

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Published date: 06-12-2012

Publisher: British Standards Institution

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Gives ratings, characteristics and inspection requirements to be included as mandatory requirements in accordance with BS CECC 50000 in any detail specification for these devices. BS AMD 7590 renumbers this standard to BS EN 150001

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Committee	ECL/24
Development Note	Renumbered and superseded by BS EN 150001. Supersedes BS E9371(1975). (09/2005)
Document Type	Standard
ISBN
Pages
Published
Publisher	British Standards Institution
Status	Superseded
Superseded By	BS EN 150001:1993
Supersedes	BS E9371(1975) : LATEST

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Equivalent Standard(s)	Relationship
CECC 50001 : 1980	Identical

Standards Referenced By This Book - (Show below) - (Hide below)

BS EN 150007:1993	Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated bipolar transistors for high frequency amplification
BS EN 150003:1993	Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated bipolar transistors for low frequency amplification
BS EN 150004:1993	Specification for harmonized system of quality assessment for electronic components. Blank detail specification: bipolar transistors for switching applications
BS EN 150006:1993	Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Variable capacitance diode(s)
BS E9375:1975	Specification. Harmonized system of quality assessment for electronic components. Blank detail specification: voltage regulator diodes and voltage reference diodes excluding precision-voltage temperature-compensated reference diodes
BS E9372:1976	Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated bipolar transistors for low and high frequency amplification

Standards Referencing This Book - (Show below) - (Hide below)

IEC 60191-2:2012 DB	Mechanical standardization of semiconductor devices - Part 2: Dimensions
CECC 50000 : 86 AMD 3	SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION FOR DISCRETE SEMICONDUCTOR DEVICES

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