BS EN 112000:1997
Current
The latest, up-to-date edition.
Harmonized system of quality assessment for electronic components. Generic specification: image converter and image intensifier tubes
Hardcopy , PDF
English
31-12-1980
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FOREWORD
PREFACE
SECTION 1 - SCOPE
SECTION 2 - GENERAL
2.1 Order of precedence
2.2 Related documents
2.3 Units, symbols and terminology
2.4 Marking
SECTION 3 - QUALITY ASSESSMENT PROCEDURES
3.1 Primary stage of manufacture
3.2 Structurally similar components
3.3 Qualification approval procedure
3.4 Supplementary procedure for qualification approval
3.5 Quality conformance inspection
3.6 Sampling requirements for small lots or for expensive
devices
3.7 Re-submission of rejected lots
3.8 Certified test records
3.9 Delayed delivery
3.10 Unchecked parameters
3.11 Periodic Inspection
3.12 Release for delivery before the completion of
Group B tests
SECTION 4 - TEST AND MEASUREMENT PROCEDURES
4.1 Alternative test methods
4.2 Standard conditions for testing
4.3 Test equipment
4.4 Visual inspection
4.5 Dimensions
4.6 Electrical and optical test and measurement procedures
4.7 Mechanical test and measurement procedures
4.8 Environmental test and measurement procedures
4.9 Endurance test and measurement procedures
General information, quality assessment procedure and test and measurement information.
| Committee |
W/-
|
| DevelopmentNote |
Renumbers and supersedes BS CECC 12000(1981) 1997 version incorporates amendment 9605 to BS CECC 12000(1981) Supersedes 75/24369 DC (09/2003)
|
| DocumentType |
Standard
|
| Pages |
26
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| EN 112000:1992 | Identical |
| NEN EN 112000 : 1997 | Identical |
| DIN EN 112000:1996-10 | Identical |
| BS E9006(1976) : LATEST | HARMONISED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BASIC SPECIFICATION. ENVIRONMENTAL PROCEDURES |
| IEC 60134:1961 | Rating systems for electronic tubes and valves and analogous semiconductor devices |
| BS E9007:1975 | Specification for harmonized system of quality assessment for electronic components: Basic specification: Sampling plans and procedures for inspection by attributes |
| IEC 60306-1:1969 | Measurement of photosensitive devices - Part 1: Basic recommendations |
| BS E9000-1(1977) : LATEST | |
| BS 4727(1971) : LATEST | |
| BS 6001(1972) : AMD 5054 | SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - SPECIFICATION FOR SAMPLING PLANS INDEXED BY ACCEPTABLE QUALITY LEVEL (AQL) FOR LOT - BY - LOT INSPECTION |
| BS E9000-2(1978) : LATEST | |
| CECC 00400 : 86 ERRATUM 92 | HANDBOOK FOR THE PRODUCTION OF CECC DOCUMENTS |
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