BS EN 16602-60-15:2014
Current
The latest, up-to-date edition.
Space product assurance. Radiation hardness assurance. EEE components
Hardcopy , PDF
English
30-09-2014
Important note : Users cannot be edited or removed once added to your Multi user PDF.
Foreword
1 Scope
2 Normative references
3 Terms, definitions and abbreviated terms
4 Principles
5 Requirements
Annex A (normative) - Mission radiation environment
specification - DRD
Annex B (normative) - Radiation analysis
report - DRD
Bibliography
Describes the requirements for ensuring radiation Hardness assurance (RHA) of space projects.
| Committee |
ACE/68
|
| DocumentType |
Standard
|
| Pages |
36
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
This standard specifies the requirements for ensuring radiation hardness assurance (RHA) of space projects. These requirements form the basis for a RHA program that is required for all space projects in conformance to ECSS-Q-ST-60. RHA program is project specific. This standard addresses the three main radiation effects on electronic components: Total Ionizing Dose (TID), Displacement Damage or Total Non-Ionizing Dose (TNID), and Single event Effects (SEE). Spacecraft charging effects are out of the scope of this standard. In this standard the word “component?? refers to Electrical, Electronic, and Electromechanical (EEE) components only. Other fundamental constituents of space hardware units and sub-systems such as solar cells, optical materials, adhesives, polymers, and any other material are not covered by this standard. This standard may be tailored for the specific characteristic and constrains of a space project in conformance with ECSS-S-ST-00.
| Standards | Relationship |
| EN 16602-60-15:2014 | Identical |
| MIL-HDBK-814 Base Document:1994 | IONIZING DOSE AND NEUTRON HARDNESS ASSURANCE GUIDELINES FOR MICROCIRCUITS AND SEMICONDUCTOR DEVICES |
| MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
| EN 16602-30-11:2014 | Space product assurance - Derating - EEE components |
| MIL-STD-750 Revision F:2011 | TEST METHODS FOR SEMICONDUCTOR DEVICES |
| EN 16603-10-04:2015 | Space engineering - Space environment |
| EN 16601-00-01:2015 | Space systems - Glossary of terms |
| EN 16602-10-09:2014 | Space product assurance - Nonconformance control system |
| EN 16603-10-12:2014 | Space engineering - Method for the calculation of radiation received and its effects, and a policy for design margins |
| EN 16602-60:2015 | Space product assurance - Electrical, electronic and electromechanical (EEE) components |
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