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  • BS EN 170000:1999

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    Withdrawn A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
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    Harmonized system of quality assessment for electronic components. Generic specification: waveguide type dielectric resonators

    Available format(s):  Hardcopy, PDF

    Withdrawn date:  21-06-2011

    Language(s):  English

    Published date:  15-12-1999

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    1 General
          1.1 Scope
          1.2 Normative references
          1.3 Units, symbols and terminology
          1.4 Preferred ratings and characteristics
          1.5 Marking
          1.6 Order of precedence
    2 Quality assessment procedures
          2.1 General
          2.2 Primary stage of manufacture
          2.3 Structurally similar components
          2.4 Sub-contracting
          2.5 Manufacturer's approval
          2.6 Approval procedures
          2.7 Procedures for capability approval
          2.8 Procedures for qualification approval
          2.9 Test procedures
          2.10 Screening requirements
          2.11 Repair work
          2.12 Certified test records
          2.13 Validity of release
          2.14 Release for delivery
          2.15 Unchecked parameters
    3 Test and measurement procedures
          3.1 General
          3.2 Test and measurement conditions
          3.3 Visual inspection
          3.4 Dimension and gauging procedure
          3.5 Electrical test procedures
                 3.5.1 General
                 3.5.2 Transmission characteristics of
                          TE01delta and TEM mode band-pass
                          type resonators
                 3.5.3 Transmission characteristics of
                          TE01delta mode band-stop resonator
                 3.5.4 Dielectric characteristics measurement
          3.6 Mechanical and environmental test procedures
                 3.6.1 Storage
                 3.6.2 High temperature ageing
                 3.6.3 Robustness of terminations
                 3.6.4 Soldering
                 3.6.5 Rapid change of temperature
                 3.6.6 Bump
                 3.6.7 Vibration
                 3.6.8 Shock
                 3.6.9 Acceleration, steady rate
                 3.6.10 Climatic test
                 3.6.11 Dry heat
                 3.6.12 Damp heat, cyclic
                 3.6.13 Cold
                 3.6.14 Damp heat, steady state
                 3.6.15 Low air pressure

    Abstract - (Show below) - (Hide below)

    Applicable to waveguide type dielectric resonators of assessed quality using capability approval or qualification approval methods. Supplies the test and measurement methods which may be selected for use in detail specification for such resonators.

    General Product Information - (Show below) - (Hide below)

    Committee W/-
    Development Note Supersedes 98/230713 DC. (03/2005)
    Document Type Standard
    Publisher British Standards Institution
    Status Withdrawn
    Superseded By
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    CECC 00114-3 : 94 AMD 2 CAPABILITY APPROVAL OF AN ELECTRONIC COMPONENT MANUFACTURING ACTIVITY
    CECC 00109 : 1974 CECC RULES OF PROCEDURE: RP 9: CERTIFIED TESTS RECORDS
    HD 323.2.20 : 200S3 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST T - SOLDERING
    IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
    CECC 00111 PT3 : 1991 AMD 4 CENELEC ELECTRONIC COMPONENTS COMMITTEE - RULE OF PROCEDURE 11 - SPECIFICATIONS - PART 3: REGULATIONS CECC SPECIFICATIONS FOR COMPONENTS GENERAL AND PROFESSIONAL (CIVIL AND MILITARY) USAGE (EXCLUDING DETAIL SPECIFICATIONS)
    IEC 60068-2-58:2015+AMD1:2017 CSV Environmental testing - Part 2-58: Tests - Test Td: Test methods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD)
    IEC 60068-2-27:2008 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
    HD 323.2.13 : 200S1 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST M: LOW AIR PRESSURE
    IEC 60068-2-20:2008 Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
    EN 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
    EN 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
    IEC 60068-2-21:2006 Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
    IEC 60068-2-13:1983 Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure
    EN 60068-1:2014 Environmental testing - Part 1: General and guidance
    HD 323.2.14 : 200S2 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST N: OF TEMPERATURE
    EN 60068-2-7:1993 Environmental testing - Part 2: Tests - Test Ga: Acceleration, steady state
    IEC 60027-1:1992 Letters symbols to be used in electrical technology - Part 1: General
    HD 323.2.30 : 200S3 BASIC ENVIRONMENTAL TESTING PROCEDURES - PART 2: TESTS - TEST DB AND GUIDANCE: DAMP HEAT, CYCLIC (12 + 12-HOUR CYCLE)
    EN 60068-2-27:2009 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
    HD 323.2.3 : 200S2 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST CA - DAMP HEAT, STEADY STATE
    IEC 60068-2-3:1969 Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state
    EN 100114-1 : 1996 RULE OF PROCEDURE - QUALITY ASSESSMENT PROCEDURES - PART 1: CECC REQUIREMENTS FOR THE APPROVAL OF AN ORGANIZATION
    CECC 00114-2 : 1994 RULE OF PROCEDURE 14 - QUALITY ASSESSMENT PROCEDURES - PART 2: QUALIFICATION APPROVAL OF ELECTRONIC COMPONENTS
    EN 60068-2-21:2006 Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
    IEC 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
    IEC 60068-2-2a:1976 Supplement A - Basic environmental testing procedures - Part 2: Tests - Tests B: Dry heat
    EN 60068-2-29:1993 Environmental testing - Part 2: Tests - Test Eb and guidance: Bump
    EN 60068-2-6:2008 Environmental testing - Part 2-6: Tests - Test Fc: Vibration (sinusoidal)
    IEC 60068-2-29:1987 Environmental testing. Part 2: Tests. Test Eb and guidance: Bump
    IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
    HD 323.2.58 : 200S1 TEST TD: SOLDERABILITY, RESISTANCE TO DISSOLUTION OF METALIZATION AND TO SOLDERING HEAT OF SURFACE MOUNTING DEVICES (SMD)
    IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
    IEC 61338-1-3:1999 Waveguide type dielectric resonators - Part 1-3: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency
    IEC 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)
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