BS EN 175200:1997
Current
The latest, up-to-date edition.
Harmonized system of quality assessment for electronic components. Sectional specification: circular connectors
Hardcopy , PDF
English
15-04-1997
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1 Scope
2 General
2.1 Related documents
2.2 Terminology
2.3 Classification into climatic categories
2.4 Creepage and clearance distances
2.5 Current
2.6 Marking
2.7 Type designation - connectors
3 General requirements test and test schedules
3.1 Workmanship
3.2 Testing
3.3 Test schedule
4 Preparation of detail specifications
4.1 Titles of detail specifications (DS)
4.2 Drawing information
4.3 System of lettering
4.4 Contents of detail specifications
5 Quality assessment procedures
5.1 Primary stage of manufacture
5.2 Structurally similar components
5.3 System of levels
5.4 Grouping of tests
5.5 Qualification approval procedure
5.6 Maintenance of qualification approval
5.7 Withdrawal or suspension of qualification
approval
5.8 Significant changes
5.9 Quality conformance inspection
5.10 Certified test records (RCE)
5.11 Delivery of tested connectors
5.12 Release for deliveries before the completion of
group B tests
5.13 Delayed delivery
5.14 In-process testing
6 Preparation of detail specifications
Annexes
A System of lettering
B Additional requirements applying to IEC 512 tests
C Additional test methods
D Additional Component Approval Procedures
Covers ratings, testing and examination.
| Committee |
EPL/48
|
| DevelopmentNote |
Renumbers and supersedes BS CECC75200(1986). 92 version incorporates amendment 7483 to BS CECC75200(1986). Supersedes 94/205862 DC. (09/2005)
|
| DocumentType |
Standard
|
| Pages |
74
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| I.S. EN 175200:1998 | Identical |
| EN 175200:1996 | Identical |
| SN EN 175200 : 1996 | Identical |
| NEN EN 175200 : 1996 | Identical |
| DIN EN 175200:1996-11 | Identical |
| UNE-EN 175200:1997 | Identical |
| CECC 75200 : 85 AMD 1 | Identical |
| BS CECC 75201:1992 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Interim example. Detail specification/blank detail specification. Circular connectors for frequencies below 3 MHz |
| IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
| EN 2591:1992 | Aerospace series - Elements of electrical and optical connection - Test methods - General |
| CECC 00100 : 1988 | BASIC RULES - TO BE USED IN CONNECTION WITH THE INTERNAL REGULATIONS OF THE FEN e.V |
| IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
| CECC 00009 : 1980 | BASIC SPECIFICATION: BASIC TESTING PROCEDURES AND MEASURING METHODS FOR ELECTROMECHANICAL COMPONENTS |
| CECC 00007 : 1978 | BASIC SPECIFICATION: SAMPLING PLANS AND PROCEDURES FOR INSPECTION BY ATTRIBUTES |
| IEC 60050-581:2008 | International Electrotechnical Vocabulary (IEV) - Part 581: Electromechanical components for electronic equipment |
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