BS EN 60444-3:1997
Current
The latest, up-to-date edition.
Measurement of quartz crystal unit parameters Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a π-network with compensation of the parallel capacitance C0
Hardcopy , PDF
English
15-09-1993
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Committees responsible
National foreword
Method
1 Scope
2 Co compensation circuit
2.1 Electrical specifications
2.2 Mechanical specification
3 Crystal unit parameters with and without Co
compensation
3.1 Series resonance frequency fs and resonance
frequency fr
3.2 Motional resistance Rl and resonance resistance
Rr
3.3 Motional capacitance Cl and motional inductance
Ll
4 Test circuit
4.1 The pi-network
4.2 Accessories of the pi-network
4.3 Associated equipment
4.4 Compensation circuit
5 Method of measurement
5.1 Initial calibration of the pi-network
5.2 Tuning of the compensation circuit
5.3 Frequency and resistance measurement
5.4 Evaluation of the motional capitance Cl and
motional inductance Ll
Appendices
A Analysis of the difference of f, R, Cl and Ll as result
of measurement methods with and without compensation of Co
B Additional information on accuracy
C Additional information on circuit components given in
Figures 4a) and 4b)
Table
A1 Typical values for parameters of oscillator crystal units
and the calculated theoretical differences between
parameters increased with and without compensation
Figures
1 Equivalent circuit of a crystal unit with compensation
of Co
2 Impedance diagram of a crystal unit without compensation
of parallel capacitance Co
3 Impedance diagram of a crystal unit when Co is
compensated with a properly tuned compensation network
according to Figure 1
4a Simplified diagram of the pi-network with electrical
adjustment of Co compensation
4b Simplified diagram of the pi-network with mechanical
adjustment of Co compensation
5 Test circuit
Defines a method for measuring the parameters of quartz crystal units by means of an inductance for compensation for the effects of Co at the frequency of the crystal unit, with accuracy dependent on the type of crystals for frequency with a fractional accuracy ranging between 10-6 and 10-8, 2% and 5% and motional capacitance and inductance with a fractional accuracy between 3% and 7%.
| Committee |
W/-
|
| DevelopmentNote |
Renumbers and supersedes BS 7681-3(1993) 1997 version incorporates amendment 9659 to BS 7681-3(1993) Also numbered as IEC 60444-3 (11/2005)
|
| DocumentType |
Standard
|
| Pages |
20
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| I.S. EN 60444-3:1999 | Identical |
| NF EN 60444-3 : 2001 | Identical |
| EN 60444-3:1997 | Identical |
| DIN EN 60444-3:1997-10 | Identical |
| NBN EN 60444-3 : 1997 | Identical |
| SN EN 60444-3 : 1997 | Identical |
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