BS EN 60679-6:2011
Current
The latest, up-to-date edition.
Quartz crystal controlled oscillators of assessed quality Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guidelines
Hardcopy , PDF
English
30-06-2011
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INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and general concepts
4 Measurement method
5 Measurement and the measurement environment
6 Measurement
7 Other points to be noted
8 Miscellaneous
Annex A (normative) - Calculation method for the
amount of phase jitter
Bibliography
Annex ZA (normative) - Normative references to international
publications with their corresponding European
publications
Pertains to the phase jitter measurement of quartz crystal oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter that allows the accurate measurement of r.m.s. jitter.
| Committee |
W/-
|
| DevelopmentNote |
Supersedes DD IEC PAS 60679-6. (06/2011) Supersedes 08/30191168 DC. (07/2011)
|
| DocumentType |
Standard
|
| Pages |
26
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
This part of the IEC 60679 series applies to the phase jitter measurement of quartz crystal oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter that allows the accurate measurement of r.m.s. jitter.
In the measurement method, phase noise measurement equipment or a phase noise measurement system is used.
The measuring frequency range is from 10 MHz to1 000 MHz.
This standard applies to quartz crystal oscillators and SAW oscillators used in electronic devices and modules that have the multiplication or division functions based on these oscillators. The type of phase jitter applied to these oscillators is the r.m.s. jitter. In the following text, these oscillators and modules will be referred to as “oscillator(s)” for simplicity.
| Standards | Relationship |
| EN 60679-6:2011 | Identical |
| IEC 60679-6:2011 | Identical |
| IEC 61082-1:2006 | Identical |
| EN 61082-1:2006 | Identical |
| IEC TS 61994-3:2011 | Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 3: Piezoelectric and dielectric oscillators |
| IEC 60679-1:2017 | Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification |
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