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BS EN 60749-29:2003

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

Semiconductor devices. Mechanical and climatic test methods Latch-up test

Available format(s)

Hardcopy , PDF

Superseded date

01-01-2011

Superseded by

BS EN 60749-29:2011

Language(s)

English

Published date

29-06-2004

Committee
EPL/47
DocumentType
Standard
Pages
24
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing \'No Trouble Found\' and \'Electrical Overstress\' failures due to latch-up.

Standards Relationship
EN 61334-6:2000 Identical
IEC 60749-29:2003 Identical

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