BS EN 60749-29:2003
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Semiconductor devices. Mechanical and climatic test methods Latch-up test
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
29-06-2004
Publisher
Superseded date
01-01-2011
Superseded by
€263.42
Excluding VAT
| Committee |
EPL/47
|
| DocumentType |
Standard
|
| Pages |
24
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing \'No Trouble Found\' and \'Electrical Overstress\' failures due to latch-up.
| Standards | Relationship |
| EN 61334-6:2000 | Identical |
| IEC 60749-29:2003 | Identical |
| I.S. EN 60749-29:2003 | Equivalent |
| EN 60749-29:2003 | Equivalent |
| IEC 61196-6:2009 | Identical |
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