BS EN 60749-29:2011
Current
The latest, up-to-date edition.
Semiconductor devices. Mechanical and climatic test methods Latch-up test
Hardcopy , PDF
English
31-08-2011
1 Scope and object
2 Terms and definitions
3 Classification and levels
4 Apparatus and material
5 Procedure
6 Failure criteria
7 Summary
Annex A (informative) - Examples of special pins
that are connected to passive components
Annex B (informative) - Calculation of operating
ambient or operating case temperature for
a given operating junction temperature
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