BS EN 60749-34:2004
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Semiconductor devices. Mechanical and climatic test methods Power cycling
Hardcopy , PDF
01-01-2010
English
22-06-2004
| Committee |
EPL/47
|
| DocumentType |
Standard
|
| Pages |
12
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
Used to determine the resistance of a semiconductor device to thermal and mechanical stresses due to cycling the power dissipation of the internal semiconductor die and internal connectors. This happens when low-voltage operating biases for forward conduction (load currents) are periodically applied and removed causing rapid changes of temperature. The power cycling test is complementary to high temperature operating life.
| Standards | Relationship |
| EN 60749-34:2004 | Identical |
| IEC 60749-34:2004 | Identical |
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