BS EN 61164:2004
Current
The latest, up-to-date edition.
Reliability growth. Statistical test and estimation methods
Hardcopy , PDF
English
02-09-2004
1 Scope
2 Normative references
3 Terms and definitions
4 Symbols
5 Reliability growth models in design and test
6 Reliability growth models used for systems/products in
design phase
6.1 Modified power law model for planning of reliability
growth in product design phase
6.1.1 General
6.1.2 Planning model for the reliability growth during
the product design period
6.1.3 Tracking the achieved reliability growth
6.2 Modified Bayesian IBM-Rosner model for planning
reliability growth in design phase
6.2.1 General
6.2.2 Data requirements
6.2.3 Estimates of reliability growth and related
parameters
6.2.4 Tracking reliability growth during design phase
7 Reliability growth planning a tracking in the product
reliability growth testing
7.1 Continuous reliability growth models
7.1.1 The power law model
7.1.2 The fixed number of faults model
7.2 Discrete reliability growth model
7.2.1 Model description
7.2.2 Estimation
8 Use of the power law model in planning reliability improvement
test programmes
9 Statistical test and estimation procedures for continuous
power law model
9.1 Overview
9.2 Growth tests and parameter estimation
9.2.1 Case 1 - Time data for every relevant failure
9.2.2 Case 2 - Time data for groups of relevant failures
9.3 Goodness-of-fit tests
9.3.1 General
9.3.2 Case 1 - Time data for every relevant failure
9.3.3 Case 2 - Time data for groups of relevant failures
9.4 Confidence intervals on the shape parameter
9.4.1 General
9.4.2 Case 1 - Time data for every relevant failure
9.4.3 Case 2 - Time data for groups of relevant failures
9.5 Confidence intervals on current MTBF
9.5.1 General
9.5.2 Case 1 - Time data for every relevant failure
9.5.3 Case 2 - Time data for groups of relevant failures
9.6 Projection technique
Annex A (informative) Examples for planning and analytical
models used in design and test phase of
product development
A.1 Reliability growth planning in product design phase
A.1.1 Power law planning model example
A.1.2 Construction of the model and monitoring of
reliability growth
A.2 Example of Bayesian reliability growth model for the
product design phase
A.3 Failure data for discrete trials
A.4 Examples of reliability growth through testing
A.4.1 Introduction
A.4.2 Current reliability assessments
A.4.3 Projected reliability estimates
Annex B (informative) The power law reliability growth
model - Background information
B.1 The Duane postulate
B.2 The power law model
B.3 Modified power law model for planning of reliability
growth in product design phase
B.4 Modified Bayesian IBM-Rosner model for planning
reliability growth in the design phase
Annex ZA (normative) Normative references to international
publications with their corresponding
European publications
Provides models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests.
Committee |
DS/1
|
DevelopmentNote |
Supersedes BS 5760-17(1995) and 02/400500 DC. (09/2004)
|
DocumentType |
Standard
|
Pages |
58
|
PublisherName |
British Standards Institution
|
Status |
Current
|
Supersedes |
IEC 61164:2004 gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests. The main changes with respect to the previous edition are:
- addition of two statistical models for reliability growth planning and tracking in the product design phase;
- statistical methods for the reliability growth programme in the design phase of IEC 61014;
- addition of the discrete reliability growth model for the test phase;
- addition of the fixed number of faults model for the test phase, clarification of the symbols used for various models;
- addition of real lif examples for most of the statistical models;
- numerical correction of tables in the reliability growth test example.
This publication is to be read in conjunction with IEC 61014:2003.
Standards | Relationship |
NF EN 61164 : 2004 | Identical |
UNE-EN 61164:2005 | Identical |
EN 61164:2004 | Identical |
IEC 61164:2004 | Identical |
NBN EN 61164 : 2005 | Identical |
I.S. EN 61164:2004 | Identical |
DIN EN 61164:2004-11 | Identical |
IEC 60605-4:2001 | Equipment reliability testing - Part 4: Statistical procedures for exponential distribution - Point estimates, confidence intervals, prediction intervals and tolerance intervals |
IEC 61014:2003 | Programmes for reliability growth |
IEC 60605-6:2007 | Equipment reliability testing - Part 6: Tests for the validity and estimation of the constant failure rate and constant failure intensity |
EN 61014:2003 | Programmes for reliability growth |
MIL-HDBK-189 Revision C:2011 | RELIABILITY GROWTH MANAGEMENT |
IEC 60300-3-5:2001 | Dependability management - Part 3-5: Application guide - Reliability test conditions and statistical test principles |
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