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  • BS EN 61643-341:2001

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    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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    Low voltage surge protective devices Specification for thyristor surge suppressors (TSS)

    Available format(s):  Hardcopy, PDF

    Superseded date:  10-07-2020

    Language(s):  English

    Published date:  15-03-2002

    Publisher:  British Standards Institution

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    Is a test specification standard for thyristor surge suppressor (TSS) components designed to limit overvoltages and divert surge currents by clipping and crowbarring actions. Such components are used in the construction of surge protective devices, particularly as they apply to telecommunications. This standard contains information on -terms, letter symbols, and definitions -basic functions, configurations and component structure -service conditions and fault modes -rating verification and characteristic measurement.

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    Committee PEL/37
    Development Note Supersedes 01/203912 DC (05/2002)
    Document Type Standard
    Publisher British Standards Institution
    Status Superseded
    Superseded By
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60050-702:1992 International Electrotechnical Vocabulary (IEV) - Part 702: Oscillations, signals and related devices
    IEC 60721-3-9:1993 Classification of environmental conditions - Part 3: Classification of groups of environmental parameters and their severities - Section 9: Microclimates inside products
    IEC 60099-4:2014 Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems
    EN 60721-3-9:1993/A1:1995 CLASSIFICATION OF ENVIRONMENTAL CONDITIONS - PART 3: CLASSIFICATION OF GROUPS OF ENVIRONMENTAL PARAMETERS AND THEIR SEVERITIES - SECTION 9: MICROCLIMATES INSIDE PRODUCTS
    EN 60749 : 99 AMD 2 2001 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS
    EN 60099-4:2014 Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems
    EN 61083-1:2001 Instruments and software used for measurement in high-voltage impulse tests - Part 1: Requirements for instruments
    IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
    IEC 60749:1996+AMD1:2000+AMD2:2001 CSV Semiconductor devices - Mechanical and climatic test methods
    IEC 60721-3-3:1994+AMD1:1995+AMD2:1996 CSV Classification of environmental conditions - Part 3-3: Classification of groups of environmental parameters and their severities - Stationary use at weatherprotected locations
    IEC 60747-6:2016 Semiconductor devices - Part 6: Discrete devices - Thyristors
    IEC 61083-1:2001 Instruments and software used for measurement in high-voltage impulse tests - Part 1: Requirements for instruments
    IEC 60747-2:2016 Semiconductor devices - Part 2: Discrete devices - Rectifier diodes
    EN 60721-3-3 : 95 AMD 2 97 CLASSIFICATION OF ENVIRONMENTAL CONDITIONS - CLASSIFICATION OF GROUPS OF ENVIRONMENTAL PARAMETERS AND THEIR SEVERITIES - STATIONARY USE AT WEATHER-PROTECTED LOCATIONS
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