BS EN 61726:2000

INTRODUCTION
1 Scope
2 Basic description of the reverberation chamber method
3 Measurement of the screening attenuation of the device
      under test (DUT)
4 Description of the test set-up
      4.1 Reverberation chamber
      4.2 Mode stirrer
      4.3 Antennas
      4.4 Test equipment
      4.5 Device under test (DUT)
      4.6 Linking devices
5 Measurement procedure
      5.1 General
      5.2 Measurement of the DUT
      5.3 Measurement of the insertion loss of the cavity
      5.4 Control of the test set-up
      5.5 Revolution speed of the mode stirrer
      5.6 Test frequencies
      5.7 Voltage standing wave ratio (VSWR)
6 Evaluation of the test results
      6.1 Screening attenuation
      6.2 Relationship between transfer impedance
             parameters and screening attenuation
      6.3 Electromagnetic field surrounding the DUT
Annex A (informative) Design of the reverberation chamber
Annex B (informative) Design of the mode stirrer
Annex C (informative) Example of a calibrator
Annex D (informative) Relationship between transfer impedance
                      and screening attenuation
Bibliography

This method is sometimes named mode stirred chamber, suitable for virtually any type of microwave component and having no theoretical upper limit. It is only limited toward low frequencies by the size of the test equipment.

Describes the measurement of screening attenuation by the reverberation, or stirred, chamber, suitable for virtually any type of microwave component and having no theoretical upper frequency limit. It is only limited toward low frequencies due to the size of the test equipment, which is frequency dependent and is only one of several methods of measuring sreening attenuation. For the purpose of this standard, examples of microwave components are waveguides, phase shifters, diplexers/multiplexers, power dividers/combiners, etc.