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  • BS EN 62132-8:2012

    Current The latest, up-to-date edition.

    Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. IC stripline method

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  31-10-2012

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    1 Scope
    2 Normative references
    3 Terms and definitions
    4 General
    5 Test conditions
    6 Test equipment
    7 Test setup
    8 Test procedure
    9 Test report
    10 RF immunity acceptance level
    Annex A (normative) - Field strength determination
    Annex B (normative) - IC stripline descriptions
    Annex C (informative) - Closed stripline
            geometrical limitations
    Bibliography
    Annex ZA (normative) - Normative references to
             international publications with their
             corresponding European publications

    Abstract - (Show below) - (Hide below)

    Defines a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances over the frequency range of 150 kHz to 3 GHz.

    Scope - (Show below) - (Hide below)

    IEC 62132-8:2012 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances over the frequency range of 150 kHz to 3 GHz.

    This publication is to be read in conjunction with IEC 62132-1:2006.

    General Product Information - (Show below) - (Hide below)

    Committee EPL/47
    Development Note Supersedes 09/30191126 DC. (10/2012)
    Document Type Standard
    Publisher British Standards Institution
    Status Current
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    EN 62132-1:2016 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
    IEC 62132-1:2015 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
    IEC 61000-4-20:2010 Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
    EN 61000-4-20:2010 ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-20: TESTING AND MEASUREMENT TECHNIQUES - EMISSION AND IMMUNITY TESTING IN TRANSVERSE ELECTROMAGNETIC (TEM) WAVEGUIDES
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