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  • IEC 62132-8:2012

    Current The latest, up-to-date edition.

    Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Language(s):  English - French

    Published date:  06-07-2012

    Publisher:  International Electrotechnical Committee

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    Abstract - (Show below) - (Hide below)

    IEC 62132-8:2012 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances over the frequency range of 150 kHz to 3 GHz.

    This publication is to be read in conjunction with IEC 62132-1:2006.

    General Product Information - (Show below) - (Hide below)

    Committee TC 47/SC 47A
    Development Note To be read in conjunction with IEC 62132-1. (07/2012) Stability Date: 2021. (11/2017)
    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Current

    Standards Referenced By This Book - (Show below) - (Hide below)

    BS EN 62132-1:2016 Integrated circuits. Measurement of electromagnetic immunity General conditions and definitions
    I.S. EN 62132-1:2016 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY - PART 1: GENERAL CONDITIONS AND DEFINITIONS
    12/30268333 DC : 0 BS EN 62132-1 - INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY - PART 1: GENERAL CONDITIONS AND DEFINITIONS
    IEC 62132-1:2015 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
    SAE ARP 6248 : 2016 STRIPLINE TEST METHOD TO CHARACTERIZE THE SHIELDING EFFECTIVENESS OF CONDUCTIVE EMI GASKETS UP TO 40 GHZ
    EN 62132-1:2016 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 62132-1:2015 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
    IEC 61000-4-20:2010 Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
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