BS EN IEC 60749-18:2019
Current
The latest, up-to-date edition.
Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
Hardcopy , PDF
English
10-06-2019
Important note : Users cannot be edited or removed once added to your Multi user PDF.This part of IEC 60749 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source.
| Committee |
EPL/47
|
| DocumentType |
Standard
|
| ISBN |
9780539002348
|
| Pages |
24
|
| ProductNote |
THIS STANDARD ALSO REFERS TO ASTM F 1892.
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
IEC 60749-18:2019 is available as IEC 60749-18:2019 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.
IEC 60749-18:2019 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source. Other suitable radiation sources can be used. This document addresses only steady-state irradiations, and is not applicable to pulse type irradiations. It is intended for military- and aerospace-related applications. It is a destructive test. This edition includes the following significant technical changes with respect to the previous edition:
- updates to subclauses to better align the test method with MIL-STD 883J, method 1019, including the use of enhanced low dose rate sensitivity (ELDRS) testing;
- addition of a Bibliography, which includes ASTM standards relevant to this test method.
| Standards | Relationship |
| EN IEC 60749-18:2019 | Identical |
| IEC 60749-18:2019 | Identical |
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