BS EN IEC 60749-41:2020
Current
The latest, up-to-date edition.
Semiconductor devices. Mechanical and climatic test methods Standard reliability testing methods of non-volatile memory devices
Hardcopy , PDF
English
09-09-2020
This part of IEC 60749 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification.
| Committee |
EPL/47
|
| DocumentType |
Standard
|
| ISBN |
9780580962875
|
| Pages |
26
|
| ProductNote |
THIS STANDARD IS ALSO REFERS TO: JESD94, JESD47
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
This Part of IEC 60749 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.
| Standards | Relationship |
| IEC 60749-41:2020 | Identical |
| EN IEC 60749-41:2020 | Identical |
| EN 61869-5:2011 | Identical |
| I.S. EN IEC 60749-41:2020 | Equivalent |
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