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BS EN ISO 13695:2004

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

Optics and photonics. Lasers and laser-related equipment. Test methods for the spectral characteristics of lasers

Available format(s)

Hardcopy , PDF

Superseded date

05-12-2024

Superseded by

BS EN ISO 13695:2024

Language(s)

English

Published date

16-07-2004

€301.50
Excluding VAT

Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definition
4 Symbols and abbreviated terms
5 Traceability
6 Measurement of wavelength and bandwidth
  6.1 General
  6.2 Types of measurements
  6.3 Equipment selection
  6.4 Measurements in air
  6.5 Measurements at low resolution
  6.6 Measurement at higher resolution
7 Measurement of wavelength stability
  7.1 Dependence of the wavelength on operating conditions
  7.2 Wavelength stability of a single frequency laser
8 Test report
Annex A (informative) Refractive index of air
Annex B (informative) Criteria for the choice of a grating
        monochromator and its accessories - Calibration
Annex C (informative) Criteria for the choice of a Fabry-Perot
        interferometer
Bibliography

Describes methods by which the spectral characteristics such as wavelength, bandwidth, spectral distribution and wavelength stability of a laser beam can be measured.

Committee
CPW/172
DevelopmentNote
Supersedes 00/703048 DC (07/2004)
DocumentType
Standard
Pages
36
PublisherName
British Standards Institution
Status
Superseded
SupersededBy
Supersedes

This International Standard specifies methods by which the spectral characteristics such as wavelength, bandwidth, spectral distribution and wavelength stability of a laser beam can be measured. This International Standard is applicable to both continuous wave (cw) and pulsed laser beams. The dependence of the spectral characteristics of a laser on its operating conditions may also be important.

IEC 60747-5-1:1997+AMD1:2001+AMD2:2002 CSV Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
ISO 12005:2003 Lasers and laser-related equipment Test methods for laser beam parameters Polarization
ISO 11145:2016 Optics and photonics Lasers and laser-related equipment Vocabulary and symbols

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