BS EN ISO 14880-4:2006
Current
Current
The latest, up-to-date edition.
Optics and photonics. Microlens arrays Test methods for geometrical properties
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
30-06-2006
Publisher
Important note : Users cannot be edited or removed once added to your Multi user PDF.| Committee |
CPW/172
|
| DevelopmentNote |
Supersedes 05/30109548 DC (06/2006)
|
| DocumentType |
Standard
|
| Pages |
34
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
This part of ISO14880 specifies methods for testing geometrical properties of microlenses in microlens arrays. It is applicable to microlens arrays with very small lenses formed on one or more surfaces of a common substrate and to graded index microlenses.
| Standards | Relationship |
| NS EN ISO 14880-4 : 1ED 2006 | Identical |
| UNE-EN ISO 14880-4:2007 | Identical |
| EN ISO 14880-4:2006 | Identical |
| SN EN ISO 14880-4 : 2006 | Identical |
| I.S. EN ISO 14880-4:2006 | Identical |
| NBN EN ISO 14880-4 : 2006 | Identical |
| ISO 14880-4:2006 | Identical |
| NEN EN ISO 14880-4 : 2006 | Identical |
| NF EN ISO 14880-4 : 2006 | Identical |
| UNI EN ISO 14880-4 : 2006 | Identical |
| DIN EN ISO 14880-4:2006-08 | Identical |
| ISO 14880-2:2006 | Optics and photonics — Microlens arrays — Part 2: Test methods for wavefront aberrations |
| ISO 4287:1997 | Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions and surface texture parameters |
| ISO 14880-1:2016 | Optics and photonics Microlens arrays Part 1: Vocabulary and general properties |
| ISO/TR 14999-1:2005 | Optics and photonics Interferometric measurement of optical elements and optical systems Part 1: Terms, definitions and fundamental relationships |
| ISO 3274:1996 | Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal characteristics of contact (stylus) instruments |
| ISO 5436-1:2000 | Geometrical Product Specifications (GPS) — Surface texture: Profile method; Measurement standards — Part 1: Material measures |
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