BS EN ISO 21068-3:2008
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Chemical analysis of silicon-carbide-containing raw materials and refractory products Determination of nitrogen, oxygen and metallic and oxidic constituents
Superseded date
21-06-2024
Superseded by
Published date
30-09-2008
Publisher
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| Committee |
RPI/1
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| DevelopmentNote |
Supersedes 06/30159551 DC. (10/2008) Reviewed & Confirmed by BSI, July 2017. (06/2017)
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| DocumentType |
Standard
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| PublisherName |
British Standards Institution
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| Status |
Superseded
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| SupersededBy | |
| Supersedes |
This part of ISO21068 specifies methods for the determination of total nitrogen and nitrogen calculated as silicon nitride, total oxygen, and free metallic and oxidic components in silicon carbide raw materials and refractory products.
It applies only to silicon carbide materials that are not bonded with nitrogen. Nitride-bonded silicon carbide refractories are covered in EN12698-1.
| Standards | Relationship |
| ISO 21068-3:2008 | Identical |
| EN ISO 21068-3:2008 | Identical |
| ISO 10081-1:2003 | Classification of dense shaped refractory products — Part 1: Alumina-silica |
| ISO 21587-1:2007 | Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) Part 1: Apparatus, reagents, dissolution and gravimetric silica |
| ISO 21079-3:2008 | Chemical analysis of refractories containing alumina, zirconia, and silica — Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method) — Part 3: Flame atomic absorption spectrophotometry (FAAS) and inductively coupled plasma emission spectrometry (ICP -AES) |
| ISO 21587-3:2007 | Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) Part 3: Inductively coupled plasma and atomic absorption spectrometry methods |
| ISO 12677:2011 | Chemical analysis of refractory products by X-ray fluorescence (XRF) Fused cast-bead method |
| EN 12698-1:2007 | Chemical analysis of nitride bonded silicon carbide refractories - Part 1: Chemical methods |
| ISO 21079-2:2008 | Chemical analysis of refractories containing alumina, zirconia, and silica — Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method) — Part 2: Wet chemical analysis |
| ISO 21587-2:2007 | Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) Part 2: Wet chemical analysis |
| ISO 10081-4:2014 | Classification of dense shaped refractory products — Part 4: Special products |
| ISO 10081-3:2003 | Classification of dense shaped refractory products — Part 3: Basic products containing from 7 % to 50 % residual carbon |
| ISO 1927:1984 | Prepared unshaped refractory materials (dense and insulating) Classification |
| ISO 10060:1993 | Dense, shaped refractory products — Test methods for products containing carbon |
| ISO 21068-2:2008 | Chemical analysis of silicon-carbide-containing raw materials and refractory products — Part 2: Determination of loss on ignition, total carbon, free carbon and silicon carbide, total and free silica and total and free silicon |
| ISO 21068-1:2008 | Chemical analysis of silicon-carbide-containing raw materials and refractory products — Part 1: General information and sample preparation |
| ISO 10081-2:2003 | Classification of dense shaped refractory products — Part 2: Basic products containing less than 7 % residual carbon |
| EN 725-3:2007 | Advanced technical ceramics - Methods of test for ceramic powders - Part 3: Determination of the oxygen content of non-oxides by thermal extraction with a carrier gas |
| ISO 26845:2008 | Chemical analysis of refractories General requirements for wet chemical analysis, atomic absorption spectrometry (AAS) and inductively coupled plasma atomic emission spectrometry (ICP-AES) methods |
| ISO 21079-1:2008 | Chemical analysis of refractories containing alumina, zirconia and silica — Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method) — Part 1: Apparatus, reagents and dissolution |
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