BS IEC 60747-5.3 : 97 AMD 13434

FOREWORD
1 Scope
2 Normative references
3 Measuring methods for photoemitters
    3.1 Luminous intensity of light-emitting diodes(lv)
    3.2 Radiant intensity of infrared-emitting diodes (le)
    3.3 Peak-emission wavelength, spectral radiation
          bandwidth and number of longitudinal modes
    3.4 Emission source length and width and astigmatism
          of a laser diode without pigtail
    3.5 Half-intensity angle and misalignment angle of
          a photoemitter
4 Measuring methods for photosensitive devices
    4.1 Reverse current under optical radiation of
          photodiodes including devices with or without
          pigtails and collector current under optical
          radiation of phototransistors
    4.2 Dark current for photodiodes and dark currents of
          phototransistors
    4.3 Collector-emitter saturation voltage of
          phototransistors
5 Measuring methods for photocouplers
     5.1 Current transfer ratio
     5.2 Input-to-output capacitance
     5.3 Isolation resistance between input and output
     5.4 Isolation test
     5.5 Partial discharges of photocouplers
     5.6 Collector-emitter saturation voltage of a
           photocoupler
     5.7 Switching times of a photocoupler
Annex A (informative) Cross references index

Covers the measuring procedures which apply to the optoelectronic devices not intended for use in the fibre optic systems or subsystems.