• BS IEC 60747-5.3 : 97 AMD 13434

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - OPTOELECTRONIC DEVICES - MEASURING METHODS

    Available format(s): 

    Superseded date:  08-01-2002

    Language(s): 

    Published date:  23-11-2012

    Publisher:  British Standards Institution

    Sorry this product is not available in your region.

    Add To Cart

    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    1 Scope
    2 Normative references
    3 Measuring methods for photoemitters
        3.1 Luminous intensity of light-emitting diodes(lv)
        3.2 Radiant intensity of infrared-emitting diodes (le)
        3.3 Peak-emission wavelength, spectral radiation
              bandwidth and number of longitudinal modes
        3.4 Emission source length and width and astigmatism
              of a laser diode without pigtail
        3.5 Half-intensity angle and misalignment angle of
              a photoemitter
    4 Measuring methods for photosensitive devices
        4.1 Reverse current under optical radiation of
              photodiodes including devices with or without
              pigtails and collector current under optical
              radiation of phototransistors
        4.2 Dark current for photodiodes and dark currents of
              phototransistors
        4.3 Collector-emitter saturation voltage of
              phototransistors
    5 Measuring methods for photocouplers
         5.1 Current transfer ratio
         5.2 Input-to-output capacitance
         5.3 Isolation resistance between input and output
         5.4 Isolation test
         5.5 Partial discharges of photocouplers
         5.6 Collector-emitter saturation voltage of a
               photocoupler
         5.7 Switching times of a photocoupler
    Annex A (informative) Cross references index

    Abstract - (Show below) - (Hide below)

    Covers the measuring procedures which apply to the optoelectronic devices not intended for use in the fibre optic systems or subsystems.

    General Product Information - (Show below) - (Hide below)

    Committee EPL/47/3
    Development Note Renumbered and superseded by BS EN 60747-5-3 (01/2002)
    Document Type Standard
    Publisher British Standards Institution
    Status Superseded
    Superseded By

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60270:2000+AMD1:2015 CSV High-voltage test techniques - Partial discharge measurements
    IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
    • Access your standards online with a subscription

      Features

      • Simple online access to standards, technical information and regulations
      • Critical updates of standards and customisable alerts and notifications
      • Multi - user online standards collection: secure, flexibile and cost effective