• BS IEC 60748-2.11 : 1999

    Current The latest, up-to-date edition.

    SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - DIGITAL INTEGRATED CIRCUITS - BLANK DETAIL SPECIFICATION FOR SINGLE SUPPLY INTEGRATED CIRCUIT, ELECTRICALLY ERASABLE, AND PROGRAMMABLE READ-ONLY MEMORY

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  01-01-1999

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    Foreword
    Introduction
    1 Marking and Ordering information
    2 Application related description
    3 Specification of the function
    4 Limiting values (absolute maximum rating system)
    5 Operating conditions (within the specified operating temperature
         range)
    6 Electrical characteristics
    7 Programming
    8 Mechanical and environmental ratings, characteristics and data
    9 Additional information
    10 Screening (if required)
    11 Quality assessment procedures
    12 Structural similarity procedures
    13 Test conditions and inspection requirements
    14 Additional measurement methods
    Reference Documents
    Table 1 - Group A: Lot-by-lot
    Table 2 - Group B: Lot-by-lot
    Table 3 - Group C: Periodic
    Table 4 - Group D

    General Product Information - (Show below) - (Hide below)

    Committee EPL/47
    Development Note Supersedes 91/30744 DC. (06/2005)
    Document Type Standard
    Publisher British Standards Institution
    Status Current
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60134:1961 Rating systems for electronic tubes and valves and analogous semiconductor devices
    IEC 60749:1996+AMD1:2000+AMD2:2001 CSV Semiconductor devices - Mechanical and climatic test methods
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